Recently we had an exciting meeting to discuss the current evolution in advanced detection in electron microscopy, with distinguished invited speakers discussing their experience of new detector technology in their respective fields of expertise.
The Merlin for EM detector was also demonstrated on the JEOL ARM300CF transmission electron Microscope – E02, one of the newly installed Microscopes at ePSIC (electron Physical Sciences Imaging Center) at Diamond Light Source Ltd.
Speakers on the day included:
Damien McGrouther, Glasgow University – Hybrid Pixel Array Detectors. Enabling novel capability in electron microscopy
Greg McMullan, MRC, Cambridge – Electron Imaging of Radiation Sensitive Sample