Recently we had an exciting meeting to discuss the current evolution in advanced detection in electron microscopy, with distinguished invited speakers discussing their experience of new detector technology in their respective fields of expertise.
The Merlin for EM detector was also demonstrated on the JEOL ARM300CF transmission electron Microscope – E02, one of the newly installed Microscopes at ePSIC (electron Physical Sciences Imaging Center) at Diamond Light Source Ltd.
Speakers on the day included:
Damien McGrouther, Glasgow University – Hybrid Pixel Array Detectors. Enabling novel capability in electron microscopy
Greg McMullan, MRC, Cambridge – Electron Imaging of Radiation Sensitive Sample
Ian MacLaren, Glasgow University – New frontiers in STEM imaging with fast pixelated direct electron detectors
Gerardo Martinez Alanis, University of Oxford – Getting the STEM into phase: applications of focused-probe electron ptychography.
Approximately thirty scientists interested in advanced detection in electron microscopy attended the very successful event. Thanks to Dima Maneuski for the photos from the day.
University of Glasgow team involved in the design of the Merlin EM mount
Dr Damien McGrouther (University of Glasgow) demonstrating the Merlin capabilities
Prof Angus Kirkland and Dr Hide Sawada
Excellent catering at the event
Dr Gerardo Martinez filling in for Prof Pete Nellist at the last minute
Dr Ian MacLaren talking about New frontiers in STEM imaging with fast pixelated direct electron detectors
The new ePSIC centre
The Merlin in its mount
The attendees from around Europe
Dr Liam o’ Ryan of Quantum Detectors giving a bit of company background
Dr Greg McMullen from Cambridge speaking about Electron Imaging of Radiation Sensitive Samples