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APPLICATIONS

The applications of our existing product range

Discovering new science is not just exciting but critical in pushing the boundaries of what is possible. Our technology enables scientific discoveries in a range of applications including those featured below.

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EXAFS

EXAFS

EXAFS (extended X-ray absorption fine structure) relies on the small fluctuations observed in the absorption coefficient close to an absorption edge to give information on the local electronic states of the species whose edge is being observed.

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XRF imaging/mapping

XRF imaging/mapping

X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays.

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Ptychography

Ptychography

Ptychography is a subset of Coherent Diffractive Imaging (CDI) which uses a coherent energy source (in our case, electrons or X-rays) to illuminate a sample and retrieve the phase information on the sample from phase-retrieval analysis of the far-field diffraction pattern.

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Spectral small-angle X-ray scattering (sSAXS)

Spectral small-angle X-ray scattering (sSAXS)

An extension to the small-angle X-ray scattering technique that promises specific advantages in lab-based experiments.

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Cryo-EM Single Particle Analysis

Cryo-EM Single Particle Analysis

Single particle analysis is a group of related computerized image processing techniques used to analyze images from transmission electron microscopy (TEM).

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Diffraction Imaging and SPED

Diffraction Imaging and SPED

MerlinEM detector offers unique opportunities for electron diffraction imaging. The simultaneous high dynamic range, high frame rate and ability to count single electrons massively expand the usefulness of this very established set of techniques. On top of this, MerlinEM is radiation safe even at 300kV so there is no need to use a beam stopper.

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4D STEM

4D STEM

Modern fast framing electron detectors like MerlinEM allow practical imaging of a full distribution of electrons for each probe position in a scanning transmission electron microscope. The most common name of the technique is 4D-STEM, however, scanned diffraction or momentum resolved STEM are also used.

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