APPLICATIONS
The applications of our existing product range
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EXAFS
EXAFS (extended X-ray absorption fine structure) relies on the small fluctuations observed in the absorption coefficient close to an absorption edge to give information on the local electronic states of the species whose edge is being observed.
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XRF imaging/mapping
X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays.
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Ptychography
Ptychography is a subset of Coherent Diffractive Imaging (CDI) which uses a coherent energy source (in our case, electrons or X-rays) to illuminate a sample and retrieve the phase information on the sample from phase-retrieval analysis of the far-field diffraction pattern.
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Spectral small-angle X-ray scattering (sSAXS)
An extension to the small-angle X-ray scattering technique that promises specific advantages in lab-based experiments.
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Cryo-EM Single Particle Analysis
Single particle analysis is a group of related computerized image processing techniques used to analyze images from transmission electron microscopy (TEM).
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Diffraction Imaging and SPED
MerlinEM detector offers unique opportunities for electron diffraction imaging. The simultaneous high dynamic range, high frame rate and ability to count single electrons massively expand the usefulness of this very established set of techniques. On top of this, MerlinEM is radiation safe even at 300kV so there is no need to use a beam stopper.
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4D STEM
Modern fast framing electron detectors like MerlinEM allow practical imaging of a full distribution of electrons for each probe position in a scanning transmission electron microscope. The most common name of the technique is 4D-STEM, however, scanned diffraction or momentum resolved STEM are also used.
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